電學特性

返回列表頁

參考價

面議

具體成交價以合同協議為準

產品型號

品牌

廠商性質代理商

所在地上海市

在線詢價收藏產品查看聯系電話

聯系方式：市場部查看聯系方式

更新時間：2025-05-12 12:14:03瀏覽次數：41次

聯系我時，請告知來自環保在線

產品分類 品牌分類

  電學特征

全部產品列表

暫無信息

鉑悅儀器（上海）有限公司廣州辦事處

經營模式：代理商

商鋪產品：148條

所在地區：上海上海

聯系人：市場部（市場）

詢價 給他留言

產品簡介

產品描述：

詳細介紹

電學特性

FEOL Electrical Characterization
In IC device manufacturing electrical characteristics of layers and films must be well controlled. Conventional contact test methods on monitor wafers, like the 4-point probe FSM offers, do no longer meet modern requirements. State of the art IC feature extremely thin, often only a few atomic layers of material. FSM's contactless RsL probe for sheet resistance and leakage as well as the non-destructive EOT probe for IC-CV measurements meet the challenge to characterize ultra shallow junctions and thin dielectric materials on production wafers.

FSM offers contact and non-contact electrical characterization metrology used in FEOL device making.

3DIC TSV and BWS TTV硅片表面形貌測量
Film Stress薄膜應力量測儀
FEOL Electrical Characterization 電學特性
Thin wafer metrology 晶圓測量學
Film Adhesion漆膜附著力測試

FSM offers contact and non-contact electrical characterization metrology used in FEOL device making.